Measurement Tool

Measurement Tool

Measurement Tool

FILM STRESS MEASUREMENT TOOL

We offer a range of advanced metrology products and solutions for semiconductor and MEMS applications, including measurement systems for film stress, wafer bow, local stress & strain in Si, SiGe and SOI using Raman Spectroscopy characterization techniques for new films, such as Thermal Desorption Spectroscopy, Quantitative Adhesion Testers, Ultra-thin Wafer Substrate

 

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THIN FILM MEASUREMENT TOOL

We offer wide range of thin film Measurement tool that measure Film Thickness in Seconds. We measure thin-film thickness by analyzing how light is reflected by the film. By analyzing wavelengths beyond those visible to the human eye we can measure nearly all non-metallic films greater than 100 atoms thick.

 

FOUR POINT PROBE SYSTEM

Four point Probe system for Sheet Resistance and Resistivity of Wafer, LCD, ITO, Solar cell, Fuel cell samples.

 

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 COATER & DEVELOPER    

 

Available but Under Construction

 

 OTHERS - REFURBISHED EQUIPMENT

 

Available but Under Construction

 

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