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F20 System

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Filmetrics – The World’s best-selling tabletop thin film thickness measurement system.  Available with a wide range of accessories and thickness coverage.

 

 

F10-AR System

 

Filmetrics - Measures reflectance and transmittance simultaneously.  Options available for thin film measurement / thickness and index measurement

 

F30 System

 

Filmetrics – Monitor and control thickness of moving films during production.  Sample rates as high as 100 Hz are possible at multiple measurement locations.  Monitors reflectance, thickness and deposition rates during MOCVD, sputtering and virtually any other deposition process

 

F40 System

 

Filmetrics - Attaches to your microscope to measure spot as small as 1µm or let us supply the entire system.

 

F50 System

 

Filmetrics – Adds automated mapping capabilities to Filmetrics F20 family of products.  Map  thin film thickness and index as fast as two points per second.

 

F10-HC System

 

Filmetrics - Measures hardcoat and anti fog film thickness and index.  Popular in automotive and other industries that hardcoat polycarbonate.  Options available for thin film measurement / thickness and index measurement

 

F60-t System

 

Filmetrics – Production ready tabletop thickness mapping system includes on-board reference, notch finding, interlocked cover and move.  Fully-automatic mapping of thin film measurement / thickness measurement and index for nearly any sample shape. 

 

F60-C System

 

Filmetrics – Cassette-to-cassette version of the F60-t.  Production ready tabletop thickness mapping system includes on-board reference, notch finding, interlocked cover and move.  Supports up to 300mm wafers.

 

F70 System

 

Filmetrics – Measures the thickness of transparent materials up to 13mm and silicon wafer thickness up to 2mm

 

F80-t System

 

Filmetrics – Production ready tabletop patterned wafer thickness mapping system capable of 15 points in 21 seconds/.   Fully-automatic mapping of thin film measurement / thickness measurement and index for nearly any sample shape. 

 

FSM 127

Optical Measurements Techniques - Imaging Low Coherence Interferometry

FSM 128

Optical Measurement Techniques - Film Stress

FSM 128L

Optical Measurement Techniques - Film Stress

FSM 413

Optical Measurement Techniques - Wafer Thickness

FSM RsL100

Electrical Measurement Techniques - Sheet Resistance and Leakage Current Mapping Tool

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