F30 System

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Filmetrics F30 - The Most Powerful Tool Available for Monitoring Thin-Film Deposition


Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the Filmetrics F30 spectral reflectance system.



Example Layers


MBE and MOCVD: Smooth and translucent, or lightly absorbing films, may be measured.  This includes virtually any semiconducting material, from AIGaN to GaInAsP.




Dramatically Improves Productivity  


Low Cost — Can pay for itself in months  


Accurate — Measure to better than ±1%  


Fast—Measurements in seconds  


Non-Invasive —    Totally outside of deposition chamber  


Easy To Use —    Intuitive Windows™ software  


Turn-Key System Sets Up In Minutes


Common Optional Accessories   


Laptop computer pre-loaded with FILMeasure software  


Lens Assemblies






Premier Solutions Pte Ltd / Filmetrics F30 System thin film measurement / thickness measurement


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