F30 System

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Description

Filmetrics F30 - The Most Powerful Tool Available for Monitoring Thin-Film Deposition

 

Measure deposition rates, film thickness, optical constants (n and k), and uniformity of semiconductors and dielectric layers in real-time with the Filmetrics F30 spectral reflectance system.

 

 

Example Layers

 

MBE and MOCVD: Smooth and translucent, or lightly absorbing films, may be measured.  This includes virtually any semiconducting material, from AIGaN to GaInAsP.

 

Benefits   

 

Dramatically Improves Productivity  

 

Low Cost — Can pay for itself in months  

 

Accurate — Measure to better than ±1%  

 

Fast—Measurements in seconds  

 

Non-Invasive —    Totally outside of deposition chamber  

 

Easy To Use —    Intuitive Windows™ software  

 

Turn-Key System Sets Up In Minutes

 

Common Optional Accessories   

 

Laptop computer pre-loaded with FILMeasure software  

 

Lens Assemblies

 

 

 

 

 

Premier Solutions Pte Ltd / Filmetrics F30 System thin film measurement / thickness measurement

 

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